Structural and surface compositional characterization of silver thin films prepared by solution growth technique

Abstract

Silver thin films were deposited on microscope glass slides by the electroless Solution Growth Technique (SGT). The films were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM), and x-ray photoelectron spectroscopy (XPS). The films were found to exhibit a random orientation with peak positions and intensity ratios approximating that of the random JCPDS powder pattern for Ag; a secondary line corresponding to AgO was observed. Calculations from XRD data show the films to have a lattice constant of 4.08608Å. XPS studies show the film surface to be composed of AgO. The influence of preparation conditions, like bath composition and deposition time on some film properties, has been studied. The bath parameters such as concentration and duration of growth greatly affect film thickness. Some reaction chemistry has been discussed.

Keywords: Solution growth technique, silver films, XRD, XPS22

Nigerian Journal of Physics Vol. 18 (2) 2006: pp. 161-170